Voyantic was showcasing the Tagformance RFID measurement system at RFID Journal Live! 2010 in Orlando April 14th to 16th. We had the full system present including the Tagformance lite measurement device, the measurement software, and the new anechoic RFID measurement cabinet. Our experts were also present, and were happy to test customers' tags onsite at booth 109.
Voyantic was also proud to announce, that they had been selected as one of the 10 finalists for the 2010 RFID Journal Best in Show Award.
Present at the show were:
Jukka Voutilainen, CEO
Email: jukka.voutilainen
voyantic.comMobile +358 50 582 6165
Jesse Tuominen, CTO
Email: jesse.tuominen
voyantic.com